|Dr. Ivan G. Petrov
is a Professor of Materials Science and Director of
the Center for Microanalysis of Materials (CMM) at the
University of Illinois, and an honorary Professor of
Surface Engineering at Sheffield Hallam University,
U.K. The CMM is an integrated facility containing the
full array - over 30 major instruments - of modern characterization
including surface microanalysis, electron microscopy,
scanning probe microscopy, x-ray scattering, and ion-beam
spectroscopies. Ivan’s research interests are
in the area of nanostructural and nanochemical analysis,
thin film physics, epitaxial growth, and interfacial
reactions. In particular, he has studied the effects
of low-energy ion-surface interactions on microstructure
evolution during transition-metal nitride layer growth.
In 2001 he was awarded an AVS Fellowship for “his
seminal contributions in determining the role of low-energy
ion/surface interactions for controlling microstructure
evolution during low temperature growth of transition
metal nitride layers." In 1996 he received the
DOE award for Sustained Outstanding Research for "growth
of new metastable nitride-based ceramic alloys, superlattices,
and multilayers with enhanced properties," and
in 1994, 1997, and 2002 the Bunshah award for the best
paper presented at the International Conference on Metallurgical
Coatings and Thin Films (ICMCTF). He earned his Ph.D.
in Physics from the Bulgarian Academy of Sciences and
was a Visiting Professor at Linköping University,
Sweden, in 1986, 1987 and 1997. Ivan has published 150
refereed papers and presented over 50 invited and plenary
lectures. He has served as chair of many conferences,
including the ICMCTF 98 and 99, an 1999 MRS-symposium
on “Advances in Materials Problem Solving with
the Electron Microscope”, Surface Analysis 2003.
Petrov has been a Guest Editor for the journals Thin
Solid Films and Surface and Coatings Technology, and
is presently a member of the Editorial Board for Vacuum.
Ivan can be reached by email at email@example.com.